TY -
BOOK
TI -
Noncontact atomic force microscopy
[1]
PB - Springer
SN - 3540431179
KW - Rasterkraftmikroskopie
PY - 2002
BT - Nanoscience and technology
BT - Physics and astronomy online library
CY - Berlin
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -