TY - BOOK
AU - Goldstein, Joseph I.
TI - Scanning electron microscopy and x-ray microanalysis
ET - 3. ed., corr. print.
PB - Springer
SN - 9780306472923
KW - Scanning electron microscopy
KW - X-ray microanalysis
KW - Rasterelektronenmikroskopie
KW - Elektronenstrahlmikroanalyse
KW - Werkstoff
KW - Raster-Transmissions-Elektronenmikroskopie
PY - 2007
N2 - Includes bibliographical references and index
CY - New York [u.a.]
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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