TY -
GEN
AU - Vanderlei, Celso Arruda
AU - Kniess, Claudia
AU - Quoniam, Luc
TI -
Patent technometry by mind maps
a study on the recycling of waste electrical and electronic equipment = Tecnometria em patentes por mapas mentais
SN - 2318-9975
KW - Aufsatz in Zeitschrift
PY - 2020
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -