TY -
BOOK
AU - Zevin, Lev S.
AU - Kimmel, Giora
AU - Mureinik, Inez
TI -
Quantitative x-ray diffractometry
PB - Springer
SN - 0387945415
KW - X-rays
KW - Diffraction
KW - Industrial applications
KW - Röntgendiffraktometrie
PY - 1995
N2 - Literaturverz. S. 355 - 364
CY - New York
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -