TY -
GEN
AU - Institute of Electrical and Electronics Engineers
AU - Components, Packaging, and Manufacturing Technology Society
AU - National Institute of Standards and Technology USA
TI -
Twenty-Second Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2006
[SEMI-THERM] ; March 14 - 16, 2006, [Dallas, TX, USA ; proceedings 2006]
PB - IEEE Service Center
SN - 1424401542
SN - 1424401534
KW - Semiconductors Cooling Congresses
KW - Semiconductors Thermal properties Congresses
KW - Konferenzschrift
PY - 2006
N2 - IEEE catalog number: 06CH37767, 06CH37767C
N2 - Parallel als Buch-Ausg. erschienen
CY - Piscataway, NJ
ER -