TY - GEN
AU - IEEE Semiconductor Thermal Measurement and Management Symposium (15th :1999 :San Diego, Calif.)
AU - IEEE Components, Hybrids, and Manufacturing Technology Society
TI - Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium San Diego, CA, USA, March 9-11, 1999
PB - IEEE
SN - 0780352653
SN - 0780352661
SN - 0780352645
SN - 9780780352650
SN - 9780780352667
SN - 9780780352643
KW - Semiconductors Thermal properties Congresses
KW - Semiconductors Cooling Congresses
KW - Konferenzschrift
PY - 1999
N2 - "IEEE Catalog Number 99CH36306"--Cover
N2 - Cover title
N2 - Includes bibliographical references
CY - Piscataway, N.J
ER -
Download citation