TY -
GEN
AU - Reymond, Loïc
AU - Huser, Thomas
AU - Ruprecht, Verena
AU - Wieser, Stefan
TI -
Modulation-enhanced localization microscopy
PB - IOP Publishing
SN - 2515-7647
KW - Electrical and Electronic Engineering
KW - Atomic and Molecular Physics, and Optics
KW - Electronic, Optical and Magnetic Materials
PY - 2020
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -