TY - GEN
AU - Lynn, P.
TI - Alternative Sequential Mixed-Mode Designs: Effects on Attrition Rates, Attrition Bias, and Costs
PB - Oxford University Press (OUP)
SN - 2325-0984
SN - 2325-0992
KW - Applied Mathematics
KW - Statistics, Probability and Uncertainty
KW - Social Sciences (miscellaneous)
KW - Statistics and Probability
PY - 2013
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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