TY - GEN
AU - Netanyahu, Nathan S.
AU - Weiss, Isaac
TI - Analytic line fitting in the presence of uniform random noise
PB - Elsevier BV
SN - 0031-3203
KW - Artificial Intelligence
KW - Computer Vision and Pattern Recognition
KW - Signal Processing
KW - Software
PY - 2001
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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