TY - GEN
AU - Maisenhölder, Bernd
AU - Zappe, Hans P.
AU - Kunz, Rino E.
AU - Riel, Peter
AU - Moser, Michael
AU - Edlinger, Johannes
TI - A GaAs/AlGaAs-based refractometer platform for integrated optical sensing applications
PB - Elsevier BV
SN - 0925-4005
KW - Materials Chemistry
KW - Electrical and Electronic Engineering
KW - Metals and Alloys
KW - Surfaces, Coatings and Films
KW - Condensed Matter Physics
KW - Instrumentation
KW - Electronic, Optical and Magnetic Materials
PY - 1997
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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