TY - GEN

AU - Schouten, Kim

AU - Frasincar, Flavius

TI - Survey on Aspect-Level Sentiment Analysis

PB - Institute of Electrical and Electronics Engineers (IEEE)

SN - 1041-4347

PY - 2016

UR - http://slubdd.de/katalog?TN_libero_mab2

ER -

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