TY - GEN
AU - Ferraro, Rudy
AU - Alia, Ruben Garcia
AU - Danzeca, Salvatore
AU - Masi, Alessandro
TI - Analysis of Bipolar Integrated Circuit Degradation Mechanisms Against Combined TID–DD Effects
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 0018-9499
SN - 1558-1578
KW - Electrical and Electronic Engineering
KW - Nuclear Energy and Engineering
KW - Nuclear and High Energy Physics
PY - 2021
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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