TY - GEN
AU - Shen, Fan
AU - Chen, Jianjun
AU - Chi, Yaqing
AU - Liang, Bin
AU - Sun, Hanhan
AU - Wen, Yi
AU - Guo, Hao
AU - Wang, Xun
TI - Research on Single Event Transients in Linear Voltage Regulators in a 28 nm Bulk CMOS Technology
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 0018-9499
SN - 1558-1578
PY - 2024
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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