TY - GEN
AU - Cattelani, Luca
AU - Murri, Martino Belvederi
AU - Chesani, Federico
AU - Chiari, Lorenzo
AU - Bandinelli, Stefania
AU - Palumbo, Pierpaolo
TI - Risk Prediction Model for Late Life Depression: Development and Validation on Three Large European Datasets
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 2168-2194
SN - 2168-2208
PY - 2019
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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