TY - GEN
AU - Padilla, Milan
AU - Michl, Bernhard
AU - Hagedorn, Nikolaus
AU - Reichel, Christian
AU - Kluska, Sven
AU - Fell, Andreas
AU - Kasemann, Martin
AU - Warta, Wilhelm
AU - Schubert, Martin C.
TI - Local Series Resistance Imaging of Silicon Solar Cells With Complex Current Paths
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 2156-3381
SN - 2156-3403
KW - Electrical and Electronic Engineering
KW - Condensed Matter Physics
KW - Electronic, Optical and Magnetic Materials
PY - 2015
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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