TY - GEN
AU - Kupke, Steve
AU - Knebel, Steve
AU - Ocker, Johannes
AU - Slesazeck, Stefan
AU - Agaiby, Rimoon
AU - Trentzsch, Martin
AU - Mikolajick, Thomas
TI - Experimental Proof of the Drain-Side Dielectric Breakdown of HKMG nMOSFETs Under Logic Circuit Operation
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 0741-3106
SN - 1558-0563
KW - Electrical and Electronic Engineering
KW - Electronic, Optical and Magnetic Materials
PY - 2015
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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