TY - GEN
AU - Kissel, Heiko
AU - Seibold, Gabriele
AU - Biesenbach, Jens
AU - Groenninger, Guenther
AU - Herrmann, Gerhard
AU - Strauß, Uwe
TI - A comprehensive reliability study of high-power 808 nm laser diodes mounted with AuSn and indium
PB - SPIE
SN - 0277-786X
PY - 2008
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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