author = { Baunack, S. AND Kötter, T.G. AND Wendrock, H. AND Wetzig, K. },

title = { AES analysis of failures in Cu based electromigration test samples },

publisher = {Elsevier BV},

isbn = {0169-4332},

keywords = { Surfaces, Coatings and Films , Condensed Matter Physics , Surfaces and Interfaces , General Physics and Astronomy , General Chemistry },

year = {2001},

url = { http://slubdd.de/katalog?TN_libero_mab2 }