author = { Duganapalli, Kishore AND Palit, Ajoy K. AND Anheier, Walter },

title = { Genetic-Algorithm-based Test Pattern Generation for Crosstalk Faults between On-Chip Aggressor and Victim },

publisher = {World Scientific Pub Co Pte Lt},

isbn = {0218-1266},

isbn = {1793-6454},

keywords = { Electrical and Electronic Engineering , Hardware and Architecture , Electrical and Electronic Engineering , Hardware and Architecture },

year = {2016},

url = { http://slubdd.de/katalog?TN_libero_mab2 }