@misc
{TN_libero_mab2,
author = {
Huang, Yu
AND
Milewski, Sylwester
AND
Rajski, Janusz
AND
Tyszer, Jerzy
AND
Wang, Chen
},
title = {
Low Cost Hypercompression of Test Data
},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
isbn = {0278-0070},
isbn = {1937-4151},
keywords = {
Electrical and Electronic Engineering
,
Computer Graphics and Computer-Aided Design
,
Software
},
year = {2020},
url = {
http://slubdd.de/katalog?TN_libero_mab2
}
}