author = { Ansari, Muhammad Adil AND Solnagi, Umair Saeed AND Kim, Jinuk AND Bughio, Ahsin Murtaza AND Park, Sungju },

title = { Time Division Multiplexing based Test Access for Stacked ICs },

publisher = {The Institute of Electronics Engineers of Korea},

isbn = {1598-1657},

isbn = {2233-4866},

keywords = { Electrical and Electronic Engineering , Electronic, Optical and Magnetic Materials },

year = {2019},

url = { http://slubdd.de/katalog?TN_libero_mab2 }