%0 Generic
%T Twenty-Second Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2006 [SEMI-THERM] ; March 14 - 16, 2006, [Dallas, TX, USA ; proceedings 2006]
%A Institute of Electrical and Electronics Engineers
%A Components, Packaging, and Manufacturing Technology Society
%A National Institute of Standards and Technology USA
%I IEEE Service Center
%@ 1424401542
%@ 1424401534
%K Semiconductors Cooling Congresses
%K Semiconductors Thermal properties Congresses
%K Konferenzschrift
%D 2006
%X IEEE catalog number: 06CH37767, 06CH37767C
%X Parallel als Buch-Ausg. erschienen
%C IEEE Service Center
%C Piscataway, NJ
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