%0 Generic
%T A methodology for characterization, modeling and mitigation of single event transient effects in CMOS standard combinational cells
%A Andjelkovic, Marko
%A Krstic, Milos
%A Schölzel, Mario
%A Lucke, Ulrike
%A Krstic, Milos
%A Michalik, Harald
%A Gössel, Michael
%I Universität Potsdam
%K Cells
%K Methodology
%K Single Event Transient
%K radiation hardness design
%K Strahlungshärte Entwurf
%D 2022
%C Universität Potsdam
%C Potsdam
%U http://slubdd.de/katalog?TN_libero_mab2
Download citation