%0 Generic
%T Transmission electron microscopy analysis of planar faults on (001) planes in MoSi2single crystals
%A Guder, Susanne
%A Bartsch, Martin
%A Messerschmidt, Ulrich
%I Informa UK Limited
%@ 1460-6992
%@ 0141-8610
%K Metals and Alloys
%K Physics and Astronomy (miscellaneous)
%K Condensed Matter Physics
%K General Materials Science
%K Electronic, Optical and Magnetic Materials
%D 2002
%C Informa UK Limited
%U http://slubdd.de/katalog?TN_libero_mab2
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