%0 Generic
%T Atomic contact potential variations of Si(111)-7 × 7 analyzed by Kelvin probe force microscopy
%A Kawai, Shigeki
%A Glatzel, Thilo
%A Hug, Hans-Josef
%A Meyer, Ernst
%I IOP Publishing
%@ 1361-6528
%@ 0957-4484
%K Electrical and Electronic Engineering
%K Mechanical Engineering
%K Mechanics of Materials
%K General Materials Science
%K General Chemistry
%K Bioengineering
%D 2010
%C IOP Publishing
%U http://slubdd.de/katalog?TN_libero_mab2
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