%0 Generic
%T Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope
%A Audinot, Jean-Nicolas
%A Philipp, Patrick
%A De Castro, Olivier
%A Biesemeier, Antje
%A Hoang, Quang Hung
%A Wirtz, Tom
%I IOP Publishing
%@ 0034-4885
%@ 1361-6633
%K General Physics and Astronomy
%D 2021
%C IOP Publishing
%U http://slubdd.de/katalog?TN_libero_mab2
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