%0
Generic
%T
Total ionizing dose effects on ring-oscillators and SRAMs in a commercial 28 nm CMOS technology
%A Borghello, G.
%A Bergamin, G.
%A Ceresa, D.
%A Pejašinović, R.
%A Diaz, F.P.
%A Kloukinas, K.
%A Pulli, A.
%A Ripamonti, G.
%A Caratelli, A.
%A Andorno, M.
%I IOP Publishing
%@ 1748-0221
%K Mathematical Physics
%K Instrumentation
%D 2023
%C IOP Publishing
%U http://slubdd.de/katalog?TN_libero_mab2