%0
Generic
%T
Modulation-enhanced localization microscopy
%A Reymond, Loïc
%A Huser, Thomas
%A Ruprecht, Verena
%A Wieser, Stefan
%I IOP Publishing
%@ 2515-7647
%K Electrical and Electronic Engineering
%K Atomic and Molecular Physics, and Optics
%K Electronic, Optical and Magnetic Materials
%D 2020
%C IOP Publishing
%U http://slubdd.de/katalog?TN_libero_mab2