%0 Generic
%T Parameter extraction method for inhomogeneous MOSFETs locally damaged by hot carrier injection
%A Haddara, Hisham S.
%A Cristoloveanu, Sorin
%I Elsevier BV
%@ 0038-1101
%K Materials Chemistry
%K Electrical and Electronic Engineering
%K Condensed Matter Physics
%K Electronic, Optical and Magnetic Materials
%D 1988
%C Elsevier BV
%U http://slubdd.de/katalog?TN_libero_mab2
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