%0 Generic
%T At-Speed Distributed Functional Testing to Detect Logic and Delay Faults in NoCs
%A Kakoee, Mohammad Reza
%A Bertacco, Valeria
%A Benini, Luca
%I Institute of Electrical and Electronics Engineers (IEEE)
%@ 0018-9340
%D 2014
%C Institute of Electrical and Electronics Engineers (IEEE)
%U http://slubdd.de/katalog?TN_libero_mab2
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