%0 Generic
%T Reliability Comparison of ZrO2-Based DRAM High-k Dielectrics Under DC and AC Stress
%A Knebel, Steve
%A Zhou, Dayu
%A Schroeder, Uwe
%A Slesazeck, Stefan
%A Pesic, Milan
%A Agaiby, Rimoon
%A Heitmann, Johannes
%A Mikolajick, Thomas
%I Institute of Electrical and Electronics Engineers (IEEE)
%@ 1558-2574
%@ 1530-4388
%K Electrical and Electronic Engineering
%K Safety, Risk, Reliability and Quality
%K Electronic, Optical and Magnetic Materials
%D 2017
%C Institute of Electrical and Electronics Engineers (IEEE)
%U http://slubdd.de/katalog?TN_libero_mab2
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