%0 Generic
%T Research on Single Event Transients in Linear Voltage Regulators in a 28 nm Bulk CMOS Technology
%A Shen, Fan
%A Chen, Jianjun
%A Chi, Yaqing
%A Liang, Bin
%A Sun, Hanhan
%A Wen, Yi
%A Guo, Hao
%A Wang, Xun
%I Institute of Electrical and Electronics Engineers (IEEE)
%@ 0018-9499
%@ 1558-1578
%D 2024
%C Institute of Electrical and Electronics Engineers (IEEE)
%U http://slubdd.de/katalog?TN_libero_mab2
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