%0
Generic
%T
Diode laser testing by taking advantage of its photoelectric properties
%A
Tomm, Jens W.
%A
Gerhardt, A.
%A
Lorenzen, Dirk
%A
Henning, P.
%A
Roehle, H.
%I
SPIE
%@
0277-786X
%D
2002
%C
SPIE
%U
http://slubdd.de/katalog?TN_libero_mab2
Download citation