%0 Generic
%T A comprehensive reliability study of high-power 808 nm laser diodes mounted with AuSn and indium
%A Kissel, Heiko
%A Seibold, Gabriele
%A Biesenbach, Jens
%A Groenninger, Guenther
%A Herrmann, Gerhard
%A Strauß, Uwe
%I SPIE
%@ 0277-786X
%D 2008
%C SPIE
%U http://slubdd.de/katalog?TN_libero_mab2
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