%0
Generic
%T
Fringing field effects in negative capacitance field-effect transistors with a ferroelectric gate insulator
%A Hattori, Junichi
%A Fukuda, Koichi
%A Ikegami, Tsutomu
%A Ota, Hiroyuki
%A Migita, Shinji
%A Asai, Hidehiro
%A Toriumi, Akira
%I IOP Publishing
%@ 0021-4922
%@ 1347-4065
%K General Physics and Astronomy
%K Physics and Astronomy (miscellaneous)
%K General Engineering
%D 2018
%C IOP Publishing