TY
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BOOK
AU
-
Lienig, Jens
AU
-
Thiele, Matthias
TI
-
Fundamentals of electromigration-aware integrated circuit design
PB
-
Springer
SN
-
9783319735573
PY
-
[2018]
CY
-
Cham
UR
-
http://slubdd.de/katalog?TN_libero_mab2
ER
-
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