author = { Altet, Josep AND Rubio, Antonio },

title = { Thermal testing of integrated circuits },

publisher = {Kluwer Acad. Publ.},

isbn = {1402070764},

keywords = { Integrated circuits Testing , Integrated circuits Thermal properties , Temperature measurements , Integrierte Schaltung , Thermodynamische Eigenschaft , Testen , Funktionstest },

year = {2002},

abstract = {Includes bibliographical references},

abstract = {Includes bibliographical references and index},

address = { Boston, Mass. [u.a.] },

url = { http://slubdd.de/katalog?TN_libero_mab2 }