TY -
BOOK
AU - Altet, Josep
AU - Rubio, Antonio
TI -
Thermal testing of integrated circuits
PB - Kluwer Acad. Publ.
SN - 1402070764
KW - Integrated circuits Testing
KW - Integrated circuits Thermal properties
KW - Temperature measurements
KW - Integrierte Schaltung
KW - Thermodynamische Eigenschaft
KW - Testen
KW - Funktionstest
PY - 2002
N2 - Includes bibliographical references
N2 - Includes bibliographical references and index
CY - Boston, Mass. [u.a.]
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -