author = { Tehranipoor, Mohammad AND Ahmad, Nisar Ahmed, Nisar },

title = { Nanometer technology designs high-quality delay tests },

publisher = {Springer},

isbn = {0387764860},

isbn = {9780387764863},

keywords = { Integrated circuits Testing , Integrated circuits Very large scale integration , Nanotechnology , Elektronisches Bauelement , Nanotechnologie },

year = {2008},

abstract = {Literaturangaben},

address = { New York, NY },

url = { http://slubdd.de/katalog?TN_libero_mab2 }