TY -
GEN
AU - Salazar, Ronald P.
AU - Marschall, Ekkehard
TI -
Thickness measurement in liquid film flow by laser scattering
PB - AIP Publishing
SN - 0034-6748
SN - 1089-7623
KW - Instrumentation
PY - 1975
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -