author = { Murtagh, M. E. AND Ward, S. AND Kelly, P. V. },

title = { Advances in photoreflectance characterisation of photonic (resonant‐cavity) and transistor epiwafers },

publisher = {Wiley},

isbn = {1862-6300},

isbn = {1862-6319},

keywords = { Materials Chemistry , Electrical and Electronic Engineering , Surfaces, Coatings and Films , Surfaces and Interfaces , Condensed Matter Physics , Electronic, Optical and Magnetic Materials },

year = {2005},

url = { http://slubdd.de/katalog?TN_libero_mab2 }