%0 Generic
%T Advances in photoreflectance characterisation of photonic (resonant‐cavity) and transistor epiwafers
%A Murtagh, M. E.
%A Ward, S.
%A Kelly, P. V.
%I Wiley
%@ 1862-6300
%@ 1862-6319
%K Materials Chemistry
%K Electrical and Electronic Engineering
%K Surfaces, Coatings and Films
%K Surfaces and Interfaces
%K Condensed Matter Physics
%K Electronic, Optical and Magnetic Materials
%D 2005
%C Wiley
%U http://slubdd.de/katalog?TN_libero_mab2
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