TY - GEN
AU - Murtagh, M. E.
AU - Ward, S.
AU - Kelly, P. V.
TI - Advances in photoreflectance characterisation of photonic (resonant‐cavity) and transistor epiwafers
PB - Wiley
SN - 1862-6300
SN - 1862-6319
KW - Materials Chemistry
KW - Electrical and Electronic Engineering
KW - Surfaces, Coatings and Films
KW - Surfaces and Interfaces
KW - Condensed Matter Physics
KW - Electronic, Optical and Magnetic Materials
PY - 2005
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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