TY - GEN
AU - Paese, Evandro
AU - Geier, Martin
AU - Homrich, Roberto Petry
AU - Rossi, Rodrigo
AU - Rosa, Pedro A. R. C.
TI - Parametric Study of the Design Variables Involved in the EMF Process of Sheet Metal
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 1051-8223
SN - 1558-2515
SN - 2378-7074
KW - Electrical and Electronic Engineering
KW - Condensed Matter Physics
KW - Electronic, Optical and Magnetic Materials
PY - 2020
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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