author = { Miccoli, Carmine AND Monzio Compagnoni, Christian AND Beltrami, Silvia AND Spinelli, Alessandro S. AND Visconti, Angelo },

title = { Threshold-Voltage Instability Due to Damage Recovery in Nanoscale NAND Flash Memories },

publisher = {Institute of Electrical and Electronics Engineers (IEEE)},

isbn = {0018-9383},

isbn = {1557-9646},

keywords = { Electrical and Electronic Engineering , Electronic, Optical and Magnetic Materials },

year = {2011},

url = { http://slubdd.de/katalog?TN_libero_mab2 }