%0 Generic
%T An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method
%A Chen, Tao
%A Park, Chulhyun
%A Chaganti, Shravan K.
%A Silva-Martinez, Jose
%A Geiger, Randall L.
%A Chen, Degang
%I Institute of Electrical and Electronics Engineers (IEEE)
%@ 0018-9456
%@ 1557-9662
%K Electrical and Electronic Engineering
%K Instrumentation
%D 2020
%C Institute of Electrical and Electronics Engineers (IEEE)
%U http://slubdd.de/katalog?TN_libero_mab2
Download citation