TY - BOOK
AU - International Symposium on Defect Recognition and Image Processing in III-V Compounds 2 1987 Monterey, Calif
TI - Defect recognition and image processing in III-V compounds 2 (DRIP II), Monterey, California, April 27 - 29, 1987
PB - Elsevier
SN - 0444428925
KW - Semiconductors Defects Congresses
KW - Konferenzschrift
PY - 1987
BT - Materials science monographs ; 44
CY - Amsterdam
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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