TY -
GEN
AU - Bughio, AHSIN MURTAZA
TI -
Variability analysis of FinFET AC/RF performances through efficient physics-based simulations for the optimization of RF CMOS stages
PB - Politecnico di Torino
PY - 2018
CY - [Erscheinungsort nicht ermittelbar]
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -