TY - BOOK
AU - Nakamura, Takashi
TI - Terrestrial neutron-induced soft errors in advanced memory devices
PB - World Scientific
SN - 9812778810
SN - 9789812778819
KW - Semiconductor storage devices
KW - Soft errors (Computer science)
KW - Neutron irradiation
KW - Radiation dosimetry
KW - Nuclear physics
PY - 2008
N2 - IntroductionTerrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges.
N2 - Literaturangaben
CY - New Jersey [u.a.]
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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