TY - BOOK
AU - Rong, Yonghua
TI - Characterization of microstructures by analytical electron microscopy (AEM)
ET - 1. ed.
PB - Higher Education Press
PB - : Springer
SN - 9787040300925
SN - 3642201180
SN - 9783642201189
KW - Nanostructured materials
KW - Analytische Elektronenmikroskopie
PY - 2012
PY - , 2012
N2 - Literaturangaben
CY - Beijing
CY - ; Berlin
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
Download citation